Title :
Packaging of 11 MPixel CMOS-Integrated SiGe Micro-Mirror Arrays
Author :
Witvrouw, A. ; Tilmans, H.A.C. ; Bogaerts, L. ; De Moor, P. ; Bearda, T. ; Halder, S. ; Haspeslagh, L. ; Schlatmann, B. ; van Bommel, M. ; de Nooijer, C. ; Lauria, J. ; Vanneer, R. ; van Drieenhuizen, B.
Author_Institution :
IMEC, Leuven
Abstract :
This article reports for the first time on the packaging of 10 cm2 11 MPixel SiGe micro-mirror arrays, intended to be used as spatial light modulator (SLM). Due to very stringent requirements on mounted die flatness (<0.01 mrad), first-level packaging of the SLM die is done using specially designed SiC holders. To avoid trapped particles between die and holder, which would jeopardize the flatness spec, special backside cleaning of the dies (les1 0.8 mum particle/cm2) is needed before mounting the SLM die on the holder. To enable this backside cleaning and to avoid front-side particles during dicing, handling and wire bonding, a temporary wafer-level or 0-level packaging cap which can be placed and removed at room temperature was developed. Dynamic white light interferometer measurements of packaged dies showed that 99.5% of 123,648 mirrors tested are within spec.
Keywords :
CMOS integrated circuits; Ge-Si alloys; integrated optoelectronics; lead bonding; light interferometry; micromirrors; semiconductor materials; 0-level packaging; CMOS-integrated micromirror arrays; SLM die; SiGe; backside cleaning; dicing; dynamic white light interferometer; handling; mounted die flatness; spatial light modulator; wafer-level packaging; wire bonding; Cleaning; Germanium silicon alloys; Optical arrays; Optical modulation; Packaging; Silicon carbide; Silicon germanium; Wafer bonding; Wafer scale integration; Wire;
Conference_Titel :
Micro Electro Mechanical Systems, 2009. MEMS 2009. IEEE 22nd International Conference on
Conference_Location :
Sorrento
Print_ISBN :
978-1-4244-2977-6
Electronic_ISBN :
1084-6999
DOI :
10.1109/MEMSYS.2009.4805337