DocumentCode :
3042876
Title :
Resonant Frequency Tuning of Torsional Microscanner by Mechanical Restriction using MEMS Actuator
Author :
Lee, Jae-Ik ; Park, Sunwoo ; Eun, Youngkee ; Jeong, Bongwon ; Kim, Jongbaeg
Author_Institution :
Sch. of Mech. Eng., Yonsei Univ., Seoul
fYear :
2009
fDate :
25-29 Jan. 2009
Firstpage :
164
Lastpage :
167
Abstract :
We have demonstrated resonant frequency-tuning of electrostatic torsional microscanners actuated by the staggered vertical comb (SVC) sets. Mechanical restriction unit composed of thermal actuator, scissor mechanism and shaft-holder is used for continuous and reversible resonant frequency tuning. The microscanner and tuning mechanism are fabricated on single crystal silicon of double Silicon-On-Insulator (DSOI) wafer in order to make vertically self-aligned comb sets and electrically insulate the electrostatic microscanner from the thermally actuated tuning unit to prevent charge leakage. The microscanner is actuated at a resonant frequency of 1.698 kHz under driving voltages of 5 Vac and 10 Vdc without frequency tuning. As the stiffness of a torsional spring is modified gradually through the shaft-holding flexure operated by thermal actuator, the resonant frequency of the torsional microscanner is shifted up to 1.880 kHz showing the maximum tuning ratio of 10.7%.
Keywords :
electrostatic devices; microactuators; micromirrors; silicon-on-insulator; MEMS actuator; charge leakage; double silicon-on-insulator wafer; electrostatic microscanner; frequency 1.698 kHz; maximum tuning ratio; mechanical restriction unit; reversible resonant frequency tuning; scissor mechanism; shaft-holder; staggered vertical comb set; thermal actuator; torsional microscanner; voltage 10 V; voltage 5 V; Actuators; Dielectrics and electrical insulation; Electrostatics; Micromechanical devices; Resonance; Resonant frequency; Silicon on insulator technology; Static VAr compensators; Tuning; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 2009. MEMS 2009. IEEE 22nd International Conference on
Conference_Location :
Sorrento
ISSN :
1084-6999
Print_ISBN :
978-1-4244-2977-6
Electronic_ISBN :
1084-6999
Type :
conf
DOI :
10.1109/MEMSYS.2009.4805344
Filename :
4805344
Link To Document :
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