DocumentCode
3043155
Title
Highly testable and compact single output comparator
Author
Metra, Cecilia ; Favalli, Michele ; Riccò, Bruno
Author_Institution
Dipt. di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
fYear
1997
fDate
27 Apr-1 May 1997
Firstpage
210
Lastpage
215
Abstract
In this paper a single output self-checking n-input comparator is presented. The proposed circuit, which can be used as n-variable two-rail checker or as equality checker features a compact structure, is Totally-Self-Checking or Strongly Code-Disjoint with respect to a wide set of realistic faults, and requires a limited set of input code words for fault detection (thus it can be used to implement also embedded comparators)
Keywords
CMOS logic circuits; VLSI; built-in self test; comparators (circuits); fault diagnosis; VLSI; embedded comparators; equality checker; fault detection; input code words; n-variable two-rail checker; self-checking n-input comparator; single output comparator; strongly code-disjoint; totally-self-checking; Aerospace electronics; Circuit faults; Circuit testing; Electrical fault detection; Error correction; Fault detection; Fault tolerant systems; Logic; Routing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1997., 15th IEEE
Conference_Location
Monterey, CA
ISSN
1093-0167
Print_ISBN
0-8186-7810-0
Type
conf
DOI
10.1109/VTEST.1997.600272
Filename
600272
Link To Document