Phase variation analysis of triangular radiating elements on polycrystalline silicon cell

A study on phase range and phase variation of triangular radiating element is presented in this paper. In this study, the triangular element is stacked on kapton sheet positioned on top of a coverglass that protects the silicon layer. Rogers RT/ Duroid 5880 substrate is used to support the layers above. The phase range and phase slope performance of the modified element is carried out with variation size of elements within the range of 5.2 mm up to 9.6 mm. The element is designed to operate at Ku-band frequency range using CST microwave studio. It has been demonstrated from this study that the reflection phase range of the modified element can reach 375°, while the phase slope value is around 0.12 °/μm. The simulation results also show that operating frequency of the final design element works at dual frequencies in which the first resonant operates at 12.38 GHz while the second resonant works at 14.61 GHz.