Title :
Modeling and detection of dynamic errors due to reflection- and crosstalk-noise
Author_Institution :
Lab. of Cooperative Comput. & Commun., Paderborn Univ., Germany
Abstract :
A new algorithm for the generation of test sequences to detect dynamic errors due to reflection and crosstalk noise in combinational circuits is presented. Based on the circuit level a new approach for error modeling including the duration of reflection and crosstalk errors, is described. The presented algorithm takes the high influence of error durations as well as gate and transmission line delays on the testability into account
Keywords :
adders; circuit layout; circuit noise; combinational circuits; crosstalk; electromagnetic wave reflection; logic testing; transmission line theory; 3-bit adder circuit; combinational circuits; crosstalk-noise; dynamic errors; error durations; error modeling; gate delays; reflection; test sequences generation; testability; transmission line delays; Acoustic reflection; Circuit noise; Circuit testing; Combinational circuits; Crosstalk; Delay lines; Distributed parameter circuits; Electromagnetic reflection; Logic; Uncertainty;
Conference_Titel :
Design Automation Conference, 1997. Proceedings of the ASP-DAC '97 Asia and South Pacific
Conference_Location :
Chiba
Print_ISBN :
0-7803-3662-3
DOI :
10.1109/ASPDAC.1997.600273
