Title :
Built-in functional tests for fast validation of a 40Gbps coherent optical receiver SoC ASIC
Author :
Wu, Yuejian ; Thomson, Sandy ; Sun, Han ; Bontu, Chandra ; Hall, Eric
Author_Institution :
Nortel, Ottawa, ON
Abstract :
An SoC ASIC is an integration of many complex components such as analog cores, digital cores, user defined logic, memories, etc. If not properly planed, lab validation of such an ASIC can be time consuming. This paper proposes a design for validation architecture that includes a built-in functional test for fast lab validation and system integration. The proposed scheme has been adopted in a 40 Gbps coherent optical transmission ASIC, which consists of 20 M gates and four 20 Gsps ADCs.
Keywords :
analogue-digital conversion; built-in self test; optical receivers; system-on-chip; ADC; SoC ASIC; analog cores; bit rate 20 Gbit/s; bit rate 40 Gbit/s; built-in functional tests; coherent optical receiver; coherent optical transmission; digital cores; fast lab validation; system integration; user defined logic; Application specific integrated circuits; High speed optical techniques; Optical modulation; Optical polarization; Optical receivers; Optical sensors; Polarization mode dispersion; System performance; System testing; Time to market;
Conference_Titel :
SOC Conference, 2008 IEEE International
Conference_Location :
Newport Beach, CA
Print_ISBN :
978-1-4244-2596-9
Electronic_ISBN :
978-1-4244-2597-6
DOI :
10.1109/SOCC.2008.4641479