Built-in functional tests for fast validation of a 40Gbps coherent optical receiver SoC ASIC

Author

Wu, Yuejian ; Thomson, Sandy ; Sun, Han ; Bontu, Chandra ; Hall, Eric

Author_Institution

Nortel, Ottawa, ON

fYear

2008

fDate

17-20 Sept. 2008

Firstpage

55

Lastpage

58

Abstract

An SoC ASIC is an integration of many complex components such as analog cores, digital cores, user defined logic, memories, etc. If not properly planed, lab validation of such an ASIC can be time consuming. This paper proposes a design for validation architecture that includes a built-in functional test for fast lab validation and system integration. The proposed scheme has been adopted in a 40 Gbps coherent optical transmission ASIC, which consists of 20 M gates and four 20 Gsps ADCs.

Keywords

analogue-digital conversion; built-in self test; optical receivers; system-on-chip; ADC; SoC ASIC; analog cores; bit rate 20 Gbit/s; bit rate 40 Gbit/s; built-in functional tests; coherent optical receiver; coherent optical transmission; digital cores; fast lab validation; system integration; user defined logic; Application specific integrated circuits; High speed optical techniques; Optical modulation; Optical polarization; Optical receivers; Optical sensors; Polarization mode dispersion; System performance; System testing; Time to market;

fLanguage

English

Publisher

ieee

Conference_Titel

SOC Conference, 2008 IEEE International

Conference_Location

Newport Beach, CA

Print_ISBN

978-1-4244-2596-9

Electronic_ISBN

978-1-4244-2597-6

Type

conf

DOI

10.1109/SOCC.2008.4641479

Filename

4641479