Estimating the Parameters of Semiconductor Lasers Based on Weak Optical Feedback Interferometry

Author

Jiangtao Xi ; Yanguang Yu ; Chicharo, J.F. ; Bosch, T.

Author_Institution

Sch. of Electr. Comput. & Telecommun. Eng., Wollongong Univ., NSW

fYear

2004

fDate

8-10 Dec. 2004

Firstpage

401

Lastpage

404

Abstract

The paper presents a new approach for measuring the linewidth enhancement factor (LEF) of semiconductor lasers (SL) and the optical feedback level factor C in SLs. The proposed approach is based on the analysis of self-mixing signals observed in self-mixing optical feedback interferometry. Unlike existing approaches, the approach tries to estimate the parameters LEF and C by a gradient-based optimization algorithm that achieves best data-to-theoretical model fitting. The effectiveness and accuracy of the method have been confirmed and tested by theoretical analysis and computer simulations

Keywords

laser variables measurement; light interferometry; optical feedback; semiconductor lasers; spectral line breadth; data-to-theoretical model fitting; gradient-based optimization algorithm; laser parameter estimation; linewidth enhancement factor; optical feedback level factor; self-mixing optical feedback interferometry; self-mixing signals; semiconductor lasers; weak optical feedback interferometry; Computer simulation; Laser feedback; Laser modes; Laser sintering; Optical feedback; Optical interferometry; Parameter estimation; Semiconductor lasers; Signal analysis; Testing; Linewidth enhancement factor; fitting algorithm; optical feedback; self-mixing interferometry; semiconductor laser;

fLanguage

English

Publisher

ieee

Conference_Titel

Optoelectronic and Microelectronic Materials and Devices, 2004 Conference on

Conference_Location

Brisbane, Qld.

Print_ISBN

0-7803-8820-8

Type

conf

DOI

10.1109/COMMAD.2004.1577574

Filename

1577574