DocumentCode :
304355
Title :
Residual gas analysis as a failure analysis tool for microelectronic devices
Author :
Kumar, Arun ; Carreon, Mark
Author_Institution :
SEAL Lab., El Segundo, CA, USA
fYear :
1996
fDate :
22-24 Oct 1996
Firstpage :
114
Lastpage :
115
Abstract :
Moisture measurement is the most important information obtained during the residual gas analysis (RGA) of microelectronic packages containing cavities. The MIL-STD-883, Method 1018.2 specification has a moisture requirement of 5000 ppmv maximum. In addition to moisture analysis during RGA, several other gases are also analyzed; most common gaseous species analyzed are nitrogen oxygen, carbon dioxide, hydrogen, argon, helium, fluorocarbons, methane, and ammonia. Based on this, conclusions can be made regarding the internal atmosphere, sources of moisture, hermeticity of the package, outgassing from the die attach epoxy material or other organic materials, etc., during failure analysis of devices that fail to meet the moisture requirements or do not reflect the anticipated gas composition
Keywords :
chemical analysis; failure analysis; integrated circuit packaging; moisture measurement; MIL-STD-883 Method 1018.2; cavity; die attach epoxy material; failure analysis; hermeticity; microelectronic package; moisture measurement; organic material; outgassing; residual gas analysis; Carbon dioxide; Failure analysis; Gases; Hydrogen; Information analysis; Microelectronics; Moisture measurement; Nitrogen; Organic materials; Packaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
WESCON/96
Conference_Location :
Anaheim, CA
ISSN :
1095-791X
Print_ISBN :
0-7803-3274-1
Type :
conf
DOI :
10.1109/WESCON.1996.553974
Filename :
553974
Link To Document :
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