• DocumentCode
    3043714
  • Title

    Analysis of retention time under multi-configuration on a DORGA

  • Author

    Seto, Daisaku ; Watanabe, Minoru

  • Author_Institution
    Electr. & Electron. Eng., Shizuoka Univ., Hamamatsu
  • fYear
    2008
  • fDate
    17-20 Sept. 2008
  • Firstpage
    131
  • Lastpage
    134
  • Abstract
    Optically reconfigurable gate arrays (ORGAs) have been developed to realize a large virtual gate count by adding a holographic memory onto a programmable gate array VLSI. Up to now, dynamic optically reconfigurable architecture has been proposed to increase the gate count of the ORGA-VLSI part, which uses photodiodes as dynamic memory to store a configuration context and perfectly removes static configuration memories. Consequently, extremely high gate count ORGAs have been realized. However, in this architecture, since background diffraction light of configuration contexts reduces the retention time of circuit information stored in junction capacitances of photodiodes, it has remained a concern that under multi-configuration, an optical configuration can reduce the retention time of other circuits that have already been programmed before the configuration and are functioning on a gate array. This paper clarifies that the dynamic optically reconfigurable architecture is effective even under multi-configuration.
  • Keywords
    VLSI; holographic storage; photodiodes; programmable logic arrays; VLSI; dynamic memory; dynamic optically reconfigurable architecture; holographic memory; junction capacitances; optically reconfigurable gate arrays; photodiodes; programmable gate array; virtual gate count; Capacitance; Circuits; Holographic optical components; Holography; Optical arrays; Optical diffraction; Photodiodes; Reconfigurable architectures; Ultraviolet sources; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOC Conference, 2008 IEEE International
  • Conference_Location
    Newport Beach, CA
  • Print_ISBN
    978-1-4244-2596-9
  • Electronic_ISBN
    978-1-4244-2597-6
  • Type

    conf

  • DOI
    10.1109/SOCC.2008.4641495
  • Filename
    4641495