Title :
A new low profile ionizing surface for static elimination
Author :
Larkin, William J.
Author_Institution :
Alphastat Co., Salem, MA, USA
Abstract :
This paper describes the development, testing and application of a low profile ionizing surface (LPIS) which can help overcome the problem of capacitance of charged objects. The problem of static charge removal where the capacitance of the charged object prevents its neutralization by conventional static eliminators is described as well as several problems which remain unsolved on common machines throughout the industry. For example, an object as simple as a piece of paper slides across a flat conductive surface and there is a transfer of electrons which causes the paper to stick, cling or get out of alignment. There is contact, static generation and the resultant cling and no conventional static eliminator can remove the charge because of the capacitance of the paper in the intimate contact with the conductive surface. There is no voltage to ionize. Also, dry paper is an insulator and by definition cannot be grounded to the conductive surface. How the low profile ionizing surface can overcome the effects of capacitance by being part of a machine surface is described. Testing of various conductive, fibrous, metalized and microfiber surfaces is described and results shown. Finally, applications and static electricity removal performance are described
Keywords :
capacitance; electric charge; electrostatics; ionisation; paper; charged objects capacitance; conductive surface; conductive surfaces; dry paper; electrons transfer; fibrous surfaces; low profile ionizing surface; machine surface; metalized surfaces; microfiber surfaces; static charge removal; static electricity removal performance; static elimination; static generation; testing; Capacitance; Conducting materials; Electrons; Ionization; Plastic insulation; Space charge; Strips; Testing; Voltage; Yarn;
Conference_Titel :
Industry Applications Conference, 1996. Thirty-First IAS Annual Meeting, IAS '96., Conference Record of the 1996 IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-3544-9
DOI :
10.1109/IAS.1996.559318