DocumentCode :
3044143
Title :
An energy-efficient supply voltage scheme using in-situ Pre-Error detection for on-the-fly voltage adaptation to PVT variations
Author :
Wirnshofer, Martin ; Heiss, Leonhard ; Georgakos, Georg ; Schmitt-Landsiedel, Doris
Author_Institution :
Tech. Univ. Munchen, Munich, Germany
fYear :
2011
fDate :
12-14 Dec. 2011
Firstpage :
94
Lastpage :
97
Abstract :
The presented Pre-Error voltage scheme dynamically tunes the supply voltage of digital circuits, according to PVT variations. By exploiting unused timing margin, produced by state-of-the-art worst-case designs, power consumption is minimized. Pre-Error flip-flops detect late-arriving signals in critical paths for the pre-error rate driven voltage adaptation. We use a Markov chain model to describe the voltage scheme analytically and analyze the effect of global and local variations on the closed-loop control. For an arithmetic circuit, synthesized in an industrial 65nm design-flow, an average power saving of 23% is achieved for very low error rates below 1E-11.
Keywords :
Markov processes; closed loop systems; digital integrated circuits; error detection; flip-flops; integrated circuit modelling; Markov chain model; PVT variations; arithmetic circuit; closed-loop control; digital circuits; energy-efficient supply voltage scheme; in-situ pre-error detection; on-the-fly voltage adaptation; pre-error flip-flops; size 65 nm; timing margin; Clocks; Delay; Error analysis; Markov processes; Monitoring; Power demand;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Circuits (ISIC), 2011 13th International Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-1-61284-863-1
Type :
conf
DOI :
10.1109/ISICir.2011.6131888
Filename :
6131888
Link To Document :
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