Title :
0.5-V high-speed circuit designs for nanoscale SoCs — Challenges and solutions
Author :
Itoh, Kiyoo ; Kotabe, Akira ; Hisamoto, Dai ; Tsuchiya, Ryuta ; Takemura, Riichiro
Author_Institution :
Central Res. Lab., Hitachi, Ltd., Tokyo, Japan
Abstract :
Some solutions are proposed and evaluated by simulation after the challenges facing the creation of 0.5-V nanoscale SoCs are clarified. First, the repair techniques and nanoscale FD-MOSFETs are discussed in terms of their Vt-variation. Second, 0.5-V dual-VDD dual-Vt logic circuits with gate-source reverse-biasing schemes are proposed. Third, a boosted word-voltage six-transistor (6-T) SRAM cell is evaluated with a 25-nm planar FD-SOI MOSFET and then a FinFET, revealing that the FinFET drastically improves the voltage margin and speed of the 6-T cell. Finally, the feasibility of a 0.5-V 25-nm SoC comprising a 1-Gb SRAM and 160-Mgate logic block is studied. We conclude that an SoC like this with a competitive speed while reducing the power to about one-tenth that of a conventional 1-V 32-nm CMOS LSI is possible, if the above-described devices and circuits are used and the within-wafer Vt-variations are stringently controlled and/or compensated for.
Keywords :
CMOS logic circuits; MOSFET circuits; high-speed integrated circuits; logic design; nanoelectronics; system-on-chip; 6-T cell; CMOS LSI; FinFET; boosted word-voltage six-transistor SRAM cell; gate-source reverse-biasing schemes; high-speed circuit designs; logic block; logic circuits; nanoscale FD-MOSFET; nanoscale SoC; planar FD-SOI MOSFET; repair techniques; size 25 nm; storage capacity 1 Gbit; voltage 0.5 V; voltage 1 V; Capacitance; FinFETs; Inverters; Logic gates; MOSFET circuits; Random access memory; System-on-a-chip; 0.5-V 25-nm 6-T SRAM cell; FD-MOSFETs; boosted word voltage; repair; worst design;
Conference_Titel :
Integrated Circuits (ISIC), 2011 13th International Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-1-61284-863-1
DOI :
10.1109/ISICir.2011.6131891