DocumentCode :
3044372
Title :
Optimal X¯ chart for concentrated sampling inspection
Author :
Liu, Qingchuan ; Wu, Zhang ; Xie, Ming
Author_Institution :
Sch. of Mech. & Production Eng., Nanyang Technol. Inst., Singapore
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
899
Abstract :
This article presents an optimal algorithm for the design of the X¯ control chart. The objective is to search the optimal sample size and sampling interval which maximize the effectiveness of the X¯ control chart in detecting the process mean shifts, on condition that the false alarm rate is held at a specified level. The design of this chart is applicable for the concentrated sampling inspection, where the allowed number of inspections within a given period is predefined. The effectiveness of the X¯ chart is measured by the out-of-control average time to signal (ATS). The results from the numerical studies have shown that the optimal X¯ chart is able to reduce the out-of-control ATS for the process mean shifts of any size compared to the conventional Shewhart X¯ chart
Keywords :
inspection; optimisation; statistical process control; concentrated sampling inspection; optimal X¯ chart; optimal sample size searching; optimal sampling interval; optimisation formulation; out-of-control average time to signal; process mean shifts detection; rational subgrouping; Computer industry; Control charts; Industrial control; Inspection; Monitoring; Production; Quality assurance; Sampling methods; Signal generators; Signal sampling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Management of Innovation and Technology, 2000. ICMIT 2000. Proceedings of the 2000 IEEE International Conference on
Print_ISBN :
0-7803-6652-2
Type :
conf
DOI :
10.1109/ICMIT.2000.916825
Filename :
916825
Link To Document :
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