• DocumentCode
    3044372
  • Title

    Optimal X¯ chart for concentrated sampling inspection

  • Author

    Liu, Qingchuan ; Wu, Zhang ; Xie, Ming

  • Author_Institution
    Sch. of Mech. & Production Eng., Nanyang Technol. Inst., Singapore
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    899
  • Abstract
    This article presents an optimal algorithm for the design of the X¯ control chart. The objective is to search the optimal sample size and sampling interval which maximize the effectiveness of the X¯ control chart in detecting the process mean shifts, on condition that the false alarm rate is held at a specified level. The design of this chart is applicable for the concentrated sampling inspection, where the allowed number of inspections within a given period is predefined. The effectiveness of the X¯ chart is measured by the out-of-control average time to signal (ATS). The results from the numerical studies have shown that the optimal X¯ chart is able to reduce the out-of-control ATS for the process mean shifts of any size compared to the conventional Shewhart X¯ chart
  • Keywords
    inspection; optimisation; statistical process control; concentrated sampling inspection; optimal X¯ chart; optimal sample size searching; optimal sampling interval; optimisation formulation; out-of-control average time to signal; process mean shifts detection; rational subgrouping; Computer industry; Control charts; Industrial control; Inspection; Monitoring; Production; Quality assurance; Sampling methods; Signal generators; Signal sampling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Management of Innovation and Technology, 2000. ICMIT 2000. Proceedings of the 2000 IEEE International Conference on
  • Print_ISBN
    0-7803-6652-2
  • Type

    conf

  • DOI
    10.1109/ICMIT.2000.916825
  • Filename
    916825