Control charts and process capability

Author

Wu, Zhang ; Tian, Yu

Author_Institution

Sch. of Mech. & Production Eng., Nanyang Technol. Inst., Singapore

Volume

2

fYear

2000

fDate

2000

Firstpage

904

Abstract

A new design algorithm for the X¯&S control charts is presented in this article, in which the detection power is allocated between the X¯ chart and the S chart in an optimal manner. This algorithm associates the out-of-control conditions of a process with a degraded value of the process capability ratio C_pk. Specifically, when C_pk decreases to a specified value in any possible pattern, the X¯&S control charts will give a signal within a specified time period with a predetermined confidence level. This algorithm allows the quality assurance (QA) engineers to accurately specify the performance characteristics of the control charts (i.e., the in-control and out-of-control run lengths and the associated confidence levels) and assist them to achieve the desired 6-σ solution

Keywords

quality control; statistical process control; 6-σ solution; X¯&S control charts; confidence levels; control charts; detection power; in-control run lengths; out-of-control conditions; out-of-control run lengths; performance characteristics specification; predetermined confidence level; process capability; process capability ratio; quality assurance engineers; Algorithm design and analysis; Computer displays; Control charts; Degradation; Industrial control; Process control; Production engineering; Quality assurance; Signal processing; Size control;

fLanguage

English

Publisher

ieee

Conference_Titel

Management of Innovation and Technology, 2000. ICMIT 2000. Proceedings of the 2000 IEEE International Conference on

Print_ISBN

0-7803-6652-2

Type

conf

DOI

10.1109/ICMIT.2000.916826

Filename

916826