DocumentCode :
3045487
Title :
Oblique fringe measurement by pattern correlation
Author :
Liu, Lanjiao ; Pan, Haiyan ; Xu, Jia ; Xu, Hongmei ; Yue, Yong ; Li, Dayou ; Song, Zhengxun ; Weng, Zhankun ; Hu, Zhen ; Wang, Zuobin ; Zhang, Jin
Author_Institution :
CNM & IJRCNB Centers, Changchun Univ. of Sci. & Technol., Changchun, China
fYear :
2010
fDate :
20-23 June 2010
Firstpage :
940
Lastpage :
945
Abstract :
This paper introduces a method for the determination of the slope and period of oblique and equi-spaced fringes by pattern correlation. In the method, two pairs of image patches in two different regions of a fringe pattern are selected for pattern correlation calculations, and the phase shift between the two selected regions of the fringe pattern is obtained from the phase curves computed with the correlation function. The computer simulation and experiment have shown that this method is useful in interferometry and laser interference lithography for determining the slope and period of the oblique and equi-spaced fringe patterns with the advantage of high resistance to noise. It has potential applications for the measurement of the fringe pattern period, fringe angle, phase difference, displacement, and other relevant physical quantities. In practice, it can also be used for the orientation of interference patterns and alignment of laser interference lithography systems.
Keywords :
angular measurement; correlation methods; displacement measurement; image processing; interferometry; phase measurement; computer simulation; displacement measurement; fringe angle measurement; fringe pattern period measurement; image patches; interference patterns; interferometry; laser interference lithography system; oblique fringe measurement; pattern correlation; period determination; phase difference measurement; phase shift; slope determination; Application software; Computer simulation; Displacement measurement; Electrical resistance measurement; Interference; Laser noise; Laser theory; Lithography; Phase measurement; Phase shifting interferometry; Oblique fringe; fringe measurement; interferometry; laser interference lithography; pattern correlation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information and Automation (ICIA), 2010 IEEE International Conference on
Conference_Location :
Harbin
Print_ISBN :
978-1-4244-5701-4
Type :
conf
DOI :
10.1109/ICINFA.2010.5512137
Filename :
5512137
Link To Document :
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