DocumentCode
3045497
Title
Vertically Aligned Various Lengths Doped-Silicon Microwire Arrays by Repeated Selective Vapor-Liquid-Solid Growth
Author
Kawano, Takeshi ; Ikedo, Akihito ; Kawashima, Takahiro ; Sawada, Kazuaki ; Ishida, Makoto
Author_Institution
Dept. of Electr. & Electron. Eng., Toyohashi Univ. of Technol., Toyohashi
fYear
2009
fDate
25-29 Jan. 2009
Firstpage
725
Lastpage
728
Abstract
We have proposed a growth technique of various lengths, 2-4 mum diameter, conductive-silicon micowire arrays, by repeated vapor-liquid-solid (VLS) growth of n-type silicon, using Au as the growth catalyst and a mixture gas of 1% PH3 with 100% Si2H6 as the silicon gas source. We obtained a longer 100 mum-length silicon wire by both the first growth of 50 mum-length wire and an additional growth of 50 mum-length wire over the first wire, while a shorter 50 mum-length silicon wire had simultaneously been grown from the substrate by the additional growth. We investigated the junction existing at the interface between the first and the second n-type silicon wire bodies. Current I-voltage V measurements on a two-step grown n-type/n-type silicon wire exhibit linear behavior with the overall resistance of 850 Omega, confirming no electrical barrier at the interface junction. Several bending tests on the wires with the junction confirmed no significant change in the mechanical properties of the wire. We developed the microwire arrays for a potential application to investigations of multiple cell layers in brain cortex or retina (Fig. 1). We also believe that the proposed technique becomes new approach to construct three-dimensional devices in MEMS fields.
Keywords
liquid-vapour transformations; micromechanical devices; nanowires; wires (electric); MEMS fields; conductive-silicon micowire arrays; doped-silicon microwire arrays; interface junction; multiple cell layers; repeated selective vapor-liquid-solid growth; retina cortex; silicon wire bodies; Current measurement; Electric resistance; Electric variables measurement; Electrical resistance measurement; Gold; Mechanical factors; Retina; Silicon; Testing; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems, 2009. MEMS 2009. IEEE 22nd International Conference on
Conference_Location
Sorrento
ISSN
1084-6999
Print_ISBN
978-1-4244-2977-6
Electronic_ISBN
1084-6999
Type
conf
DOI
10.1109/MEMSYS.2009.4805485
Filename
4805485
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