Title :
Low-cost and efficient digital-compatible BIST for analog circuits using pulse response sampling
Author :
Variyam, Pramodchandran N. ; Chatterjee, Abhijit ; Nagi, Naveena
Author_Institution :
Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fDate :
27 Apr-1 May 1997
Abstract :
In this paper an efficient low-cost built-in self test (BIST) scheme is proposed for analog circuits. The key idea is to use rectangular pulses of random widths obtained directly from a digital linear feedback shift register to perform transient testing of the circuit under test. A small amount of synchronization and comparison circuitry is necessary to perform the BIST. A methodology for designing the BIST hardware is described and results are discussed. The method is seen to be both efficient and low cost
Keywords :
VLSI; analogue integrated circuits; automatic testing; built-in self test; integrated circuit testing; mixed analogue-digital integrated circuits; shift registers; transient response; BIST hardware design; analog circuits; built-in self test scheme; comparison circuitry; digital linear feedback shift register; digital-compatible BIST scheme; low-cost BIST scheme; pulse response sampling; rectangular pulses; synchronization circuitry; transient testing; Analog circuits; Automatic testing; Built-in self-test; Circuit testing; Design methodology; Feedback circuits; Linear feedback shift registers; Performance evaluation; Pulse circuits; Space vector pulse width modulation;
Conference_Titel :
VLSI Test Symposium, 1997., 15th IEEE
Conference_Location :
Monterey, CA
Print_ISBN :
0-8186-7810-0
DOI :
10.1109/VTEST.1997.600285
