• DocumentCode
    304566
  • Title

    A global entropy criterion for focus tuning in exit wavefunction reconstruction in high resolution electron microscopy

  • Author

    Van Dyck, D. ; De Beeck, M. Op ; Tang, D. ; Jansen, J. ; Zandbergen, H.W.

  • Author_Institution
    Antwerp Univ., Belgium
  • Volume
    1
  • fYear
    1996
  • fDate
    16-19 Sep 1996
  • Firstpage
    737
  • Abstract
    Starting from the physical principles of the dynamical scattering of high energetic electrons in high resolution electron microscopy (HREM) a new criterion is proposed for the determination of the absolute focus of reconstructed exit wave functions
  • Keywords
    electron beam focusing; electron microscopy; entropy; image reconstruction; image resolution; tuning; wave functions; TiO2; absolute focus; dynamical scattering; focus tuning; global entropy criterion; high energetic electrons; high resolution electron microscopy; reconstructed exit wave functions; wave function reconstruction; Crystallization; Electron beams; Electron microscopy; Entropy; Focusing; Image reconstruction; Image retrieval; Pixel; Scattering; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing, 1996. Proceedings., International Conference on
  • Conference_Location
    Lausanne
  • Print_ISBN
    0-7803-3259-8
  • Type

    conf

  • DOI
    10.1109/ICIP.1996.559604
  • Filename
    559604
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=304566