Overview Of Device See Susceptibility From Heavy Ions

Author

Nichols, D.K. ; Coss, J.R. ; McCarty, K.P. ; Schwartz, H.R. ; Smith, L.S. ; Swift, G.M. ; Watson, R.K. ; Koga, R. ; Crain, W.R. ; Crawford, K.B. ; Hansel, S.J.

Author_Institution

California Institute of Technology

fYear

1993

fDate

34171

Firstpage

Lastpage

Keywords

Aerospace testing; Conferences; Error analysis; Guidelines; IEEE publications; Laboratories; Manufacturing; Propulsion; Satellites; Space technology;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation Effects Data Workshop, 1993., IEEE

Print_ISBN

0-7803-1906-0

Type

DOI

10.1109/REDW.1993.700561

Filename

700561

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