DocumentCode :
3045703
Title :
Overview Of Device See Susceptibility From Heavy Ions
Author :
Nichols, D.K. ; Coss, J.R. ; McCarty, K.P. ; Schwartz, H.R. ; Smith, L.S. ; Swift, G.M. ; Watson, R.K. ; Koga, R. ; Crain, W.R. ; Crawford, K.B. ; Hansel, S.J.
Author_Institution :
California Institute of Technology
fYear :
1993
fDate :
34171
Firstpage :
1
Lastpage :
12
Keywords :
Aerospace testing; Conferences; Error analysis; Guidelines; IEEE publications; Laboratories; Manufacturing; Propulsion; Satellites; Space technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation Effects Data Workshop, 1993., IEEE
Print_ISBN :
0-7803-1906-0
Type :
conf
DOI :
10.1109/REDW.1993.700561
Filename :
700561
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3045703
