• DocumentCode
    3045708
  • Title

    Optical quenching of lock-on currents in GaAs:Si:Cu switches

  • Author

    Roush, R. ; Mazzola, M. ; Schoenbach, K. ; Lakdawala, V.

  • Author_Institution
    Old Dominion Univ., Norfolk, VA, USA
  • fYear
    1990
  • fDate
    26-28 Jun 1990
  • Firstpage
    339
  • Lastpage
    342
  • Abstract
    Infrared quenching of lock-on currents has been demonstrated in a photoconductive GaAs:Si:Cu switch. After quenching of the persistent photocurrent, the current recovers in about 25 ns to a constant value. The persistent photo and dark currents are considered to be due to double injection of carriers through the ohmic contacts of the photoconductive switch. It is noted that optical quenching of lock-on current offers the possibility of using GaAs:Si:Cu switches in high-rep-rate inductive energy storage systems
  • Keywords
    III-V semiconductors; copper; gallium arsenide; photoconducting devices; radiation quenching; semiconductor switches; silicon; GaAs:Si,Cu photoconductive switches; IR quenching; carrier injection; dark currents; lock-on currents; ohmic contacts; optical quenching; persistent photocurrent; semiconductor; Annealing; Charge carrier processes; Conductivity; Contacts; Copper; Gallium arsenide; Geometry; Optical switches; Photoconductivity; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Modulator Symposium, 1990., IEEE Conference Record of the 1990 Nineteenth
  • Conference_Location
    San Diego, CA
  • Type

    conf

  • DOI
    10.1109/MODSYM.1990.200982
  • Filename
    200982