DocumentCode :
3045720
Title :
Practical long-life spark gaps for high-reliability applications
Author :
Caristi, R. ; Roy, J. ; Brooks, R. ; Pennell, A.
Author_Institution :
EG&G Electron. Components Div., Salem, MA, USA
fYear :
1990
fDate :
26-28 Jun 1990
Firstpage :
306
Lastpage :
312
Abstract :
Lifetimes of 107 to 108 shots have been demonstrated for small triggered spark gaps switching over 3 J/shot, and an average lifetime of 3.5×106 shots has been demonstrated for a larger gap switching over 160 J/shot. Average misfire ratios well below 1% have been achieved, with 0.1-0.5% being typical for a significant fraction of the gaps´ useful lifetimes. The authors discuss the goals of the IR and D program that led to the successful development of these gaps, the failure mechanisms that had to be overcome to achieve the desired performance, the life tests that were conducted, and the performance levels that were ultimately achieved. In addition to a long service life, the requirements of some systems mandated a very low rate of misfires. While 0.5% was deemed adequate, a misfire rate of less than 0.1% was achieved for gaps capable of 108 shots at substantial levels of switched energy and conducted charge
Keywords :
pulsed power technology; reliability; spark gaps; switching; IR and D program; failure mechanisms; lifetime; long-life spark gaps; misfire ratios; reliability; Electrodes; Electronic components; Hydrogen; Laser applications; Lithotriptors; Power lasers; Spark gaps; Switches; Thyratrons; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Modulator Symposium, 1990., IEEE Conference Record of the 1990 Nineteenth
Conference_Location :
San Diego, CA
Type :
conf
DOI :
10.1109/MODSYM.1990.200983
Filename :
200983
Link To Document :
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