Title :
Error propagation analysis for edge postprocessing
Author :
Petrou, M. ; Papachristou, P. ; Kittler, J.
Author_Institution :
Dept. of Electron. & Electr. Eng., Surrey Univ., Guildford, UK
Abstract :
A post-processing scheme for edge detectors is described, that is based on the method of probabilistic relaxation where the binary relations between the possible edgels are explicitly modelled. The probability density functions of the errors in the measurements of these quantities have been rigorously derived from the assumed Gaussian distribution of errors in the image gray values
Keywords :
Gaussian distribution; edge detection; error analysis; measurement errors; Gaussian distribution; algorithm; binary relations; edge detectors; edge postprocessing; edgels; error propagation analysis; image gray values; measurement errors; probabilistic relaxation method; probability density functions; Context modeling; Density measurement; Detectors; Dictionaries; Error analysis; Filtering; Gaussian distribution; Image edge detection; Iterative algorithms; Nonlinear filters;
Conference_Titel :
Image Processing, 1996. Proceedings., International Conference on
Conference_Location :
Lausanne
Print_ISBN :
0-7803-3259-8
DOI :
10.1109/ICIP.1996.559635
