DocumentCode :
3045890
Title :
Developmental MOS controlled thyristors (MCT) behavior
Author :
Postore, R. ; Braun, C. ; Weiner, M. ; Schneider, S.
Author_Institution :
US Army LABCOM, Fort Monmouth, NJ, USA
fYear :
1990
fDate :
26-28 Jun 1990
Firstpage :
391
Lastpage :
399
Abstract :
Although the MCT is still at an early stage of development and at the preproduction stage, experiments indicate that it has potential for pulse power and power conditioning applications. In these experiments, epitaxial substrate devices with a range of rated blocking voltages from 500 V to 1000 V and peak controllable currents from 30 A to 60 A were studied. Many of these devices were operated at up to 80% of the rated blocking voltages. The devices have turn-on times (10-90%) of about 0.5 μs and turn-off times (10-90%)⩽1.5 μs at the peak controllable current. Forward voltage drops are less than 1.5 V. Single MCTs have been operated at peak powers of 24 kW, average powers of 2 kW, and repetition rates up to 50 kHz at a 50% duty. Operation of series arrays of five devices have been demonstrated at 2000 V at 80% of the rated blocking voltage per device
Keywords :
metal-insulator-semiconductor devices; semiconductor switches; thyristors; 30 to 60 A; 500 to 1000 V; MOS controlled thyristors; epitaxial substrate devices; peak controllable currents; power conditioning; pulse power; rated blocking voltages; turn-off times; turn-on times; Anodes; Circuit testing; Delay effects; FETs; MOSFETs; Packaging; Substrates; Switches; Thyristors; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Modulator Symposium, 1990., IEEE Conference Record of the 1990 Nineteenth
Conference_Location :
San Diego, CA
Type :
conf
DOI :
10.1109/MODSYM.1990.200994
Filename :
200994
Link To Document :
بازگشت