• DocumentCode
    3045890
  • Title

    Developmental MOS controlled thyristors (MCT) behavior

  • Author

    Postore, R. ; Braun, C. ; Weiner, M. ; Schneider, S.

  • Author_Institution
    US Army LABCOM, Fort Monmouth, NJ, USA
  • fYear
    1990
  • fDate
    26-28 Jun 1990
  • Firstpage
    391
  • Lastpage
    399
  • Abstract
    Although the MCT is still at an early stage of development and at the preproduction stage, experiments indicate that it has potential for pulse power and power conditioning applications. In these experiments, epitaxial substrate devices with a range of rated blocking voltages from 500 V to 1000 V and peak controllable currents from 30 A to 60 A were studied. Many of these devices were operated at up to 80% of the rated blocking voltages. The devices have turn-on times (10-90%) of about 0.5 μs and turn-off times (10-90%)⩽1.5 μs at the peak controllable current. Forward voltage drops are less than 1.5 V. Single MCTs have been operated at peak powers of 24 kW, average powers of 2 kW, and repetition rates up to 50 kHz at a 50% duty. Operation of series arrays of five devices have been demonstrated at 2000 V at 80% of the rated blocking voltage per device
  • Keywords
    metal-insulator-semiconductor devices; semiconductor switches; thyristors; 30 to 60 A; 500 to 1000 V; MOS controlled thyristors; epitaxial substrate devices; peak controllable currents; power conditioning; pulse power; rated blocking voltages; turn-off times; turn-on times; Anodes; Circuit testing; Delay effects; FETs; MOSFETs; Packaging; Substrates; Switches; Thyristors; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Modulator Symposium, 1990., IEEE Conference Record of the 1990 Nineteenth
  • Conference_Location
    San Diego, CA
  • Type

    conf

  • DOI
    10.1109/MODSYM.1990.200994
  • Filename
    200994