DocumentCode
3045945
Title
ISFET´s threshold voltage control using bidirectional electron tunnelling
Author
Al-Ahdal, Abdulrahman ; Georgiou, Pantelis ; Toumazou, Christofer
Author_Institution
Electr. Eng. Dept., Umm Al-Qura Univ., Makkah, Saudi Arabia
fYear
2012
fDate
28-30 Nov. 2012
Firstpage
172
Lastpage
175
Abstract
Ion sensitive field effect transistors (ISFETs) built in standard CMOS technology are effectively floating gate devices. They suffer from random trapped charges that alter their threshold voltage (Vt). This paper describes one way to program an ISFET´s floating gate charges in order to bring its Vt to a desirable value using bidirectional electron tunnelling. Two inputs are capacitively coupled to the ISFET´s floating gate via matched capacitors. They are used to indirectly tunnel opposite currents across their oxide isolation to the ISFET´s floating gate in a controlled way. The floating gate charges are programmed using a balanced combination of these two tunnelling currents. Measured experimental results demonstrated programmability and removal of positive and negative trapped charges.
Keywords
CMOS integrated circuits; biomedical electronics; ion sensitive field effect transistors; tunnelling; voltage control; ISFET´s floating gate charges; ISFET´s threshold voltage control; bidirectional electron tunnelling; built-in standard CMOS technology; ion sensitive field effect transistors; matched capacitors; negative trapped charge removal; opposite current indirect tunneling; oxide isolation; positive trapped charge removal; random trapped charges; tunnelling currents; CMOS integrated circuits; Capacitors; Chemicals; Equations; Logic gates; Threshold voltage; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Biomedical Circuits and Systems Conference (BioCAS), 2012 IEEE
Conference_Location
Hsinchu
Print_ISBN
978-1-4673-2291-1
Electronic_ISBN
978-1-4673-2292-8
Type
conf
DOI
10.1109/BioCAS.2012.6418469
Filename
6418469
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