• DocumentCode
    3046037
  • Title

    Semiconducting Y-Ba-Cu-O Infrared Microbolometer Array Fabricated and Characterized with CCBDI ROIC

  • Author

    Kumar, S. ; Butler, D.P.

  • Author_Institution
    Univ. of Texas at Arlington, Arlington, TX
  • fYear
    2009
  • fDate
    25-29 Jan. 2009
  • Firstpage
    837
  • Lastpage
    840
  • Abstract
    Semiconducting Yttrium Barium Copper Oxide (Y-Ba-Cu-O) microbolometers based on self-supporting structure are fabricated and characterized with on-chip constant current buffered direct injection (CCBDI) readout integrated circuit (ROIC) in AMI 1.5 mum double-poly-double-metal n-well 2.5 V complementary metal-oxide-semiconductor (CMOS) technology. Self-supporting Y-Ba-Cu-O microbolometers exhibit low thermal mass, hence low thermal time constant, and are integrated with a silicon readout circuit for first time. The CCBDI readout circuit is designed to work both with a traditional frame rate of 30 Hz as well as a novel, improved frame rate of 200 Hz for a 640 times 480 array for faster thermal imaging in commercial, military and biomedical applications.
  • Keywords
    CMOS image sensors; barium compounds; bolometers; infrared detectors; infrared imaging; readout electronics; yttrium compounds; CCBDI ROIC; Y-Ba-Cu-O; complementary metal-oxide-semiconductor technology; double-poly-double-metal n-well CMOS technology; frequency 200 Hz; on-chip constant current buffered direct injection; readout integrated circuit; semiconducting infrared microbolometer array fabrication; thermal imaging; voltage 2.5 V; Bolometers; Circuits; Electrodes; Geometry; Immune system; Infrared detectors; Optical imaging; Semiconductivity; Voltage; Yttrium barium copper oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 2009. MEMS 2009. IEEE 22nd International Conference on
  • Conference_Location
    Sorrento
  • ISSN
    1084-6999
  • Print_ISBN
    978-1-4244-2977-6
  • Electronic_ISBN
    1084-6999
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2009.4805513
  • Filename
    4805513