DocumentCode :
3046123
Title :
Model of on-chip VGP-CPW with P+ implant in CMOS process
Author :
Wen, Jincai ; Lou, Jia ; Sun, Lingling
Author_Institution :
Key Lab. for RF Circuits & Syst. of Minist. of Educ., Hangzhou Dianzi Univ., Hangzhou, China
fYear :
2011
fDate :
12-14 Dec. 2011
Firstpage :
428
Lastpage :
431
Abstract :
This paper presents a vertical-ground-plane coplanar waveguide (VGP-CPW) line with P+ implant, and compared the characteristic parameters of transmission line with the general VGP-CPW structures. The ground plane connected to the substrate makes the proposed CPW line have higher isolation and lower characteristic impedance. The physical model of the VGP-CPW with P+ implant is presented as well as the general VGP-CPW line. Two different structures of transmission lines are fabricated in 65 nm 1P8M RF CMOS process and models are verified by the measured S-parameters up to 50 GHz.
Keywords :
CMOS integrated circuits; coplanar transmission lines; coplanar waveguides; field effect MIMIC; 1P8M RF CMOS process; P+ implant; S-parameters; frequency 50 GHz; on-chip VGP-CPW model; size 65 nm; transmission line; vertical-ground-plane coplanar waveguide line; Coplanar waveguides; Implants; Integrated circuit modeling; Semiconductor device modeling; Solid modeling; Substrates; Transmission line measurements; CMOS; P+ implant; VGP-CPW; model;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Circuits (ISIC), 2011 13th International Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-1-61284-863-1
Type :
conf
DOI :
10.1109/ISICir.2011.6131988
Filename :
6131988
Link To Document :
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