Title :
A machine parameter measurement of switched reluctance machines with egg-shape diagram
Author :
Chiba, Akira ; Masuda, T. ; Fukao, Tadashi
Author_Institution :
Dept. of Electr. Eng., Sci. Univ. of Tokyo, Japan
Abstract :
In this paper, a method for the machine parameter measurement of switched reluctance machines is proposed. Inductance variations with respect to the rotor rotational position are approximated with only a sinusoidal function and a constant. The machine parameters are the amplitude of fundamental component L1 and the constant L0. The ratio L1/L0 can be a performance index, which is close to 1 if the machine has better saliency. It is possible to measure these parameters in experiments. A series of input powers Pi and apparent powers S are measured by a digital power meter while applying square waveform voltages and changing the voltage phase angle. These measured points are plotted on a Pi-S diagram. An egg-shape theoretical curve is drawn with the least square method to find the machine parameters. Several test machines are experimented upon. It is found that machine parameters can be measured by the proposed method. It is also found that the performance index has a good correspondence with measured efficiencies
Keywords :
computerised instrumentation; least squares approximations; machine testing; machine theory; performance index; power measurement; reluctance machines; apparent power; constants; digital power meter; efficiencies; egg-shape diagram; fundamental component; inductance variations; input power; least square method; machine parameter measurement; machine saliency; performance index; rotor rotational position; sinusoidal function; square waveform voltages; switched reluctance machines; voltage phase angle; Goniometers; Inductance; Least squares approximation; Least squares methods; Performance analysis; Phase measurement; Power measurement; Reluctance machines; Testing; Voltage;
Conference_Titel :
Industry Applications Conference, 1996. Thirty-First IAS Annual Meeting, IAS '96., Conference Record of the 1996 IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-3544-9
DOI :
10.1109/IAS.1996.560167