DocumentCode :
3046359
Title :
5-10 GHz AlN Contour-Mode Nanoelectromechanical Resonators
Author :
Rinaldi, M. ; Zuniga, C. ; Piazza, G.
Author_Institution :
Dept. of Electr. & Syst. Eng., Univ. of Pennsylvania, Philadelphia, PA
fYear :
2009
fDate :
25-29 Jan. 2009
Firstpage :
916
Lastpage :
919
Abstract :
This paper reports on the design and experimental verification of super high frequency (SHF) laterally vibrating nanoelctromechanical (NEMS) resonators. For the first time, AlN piezoelectric nanoresonators with multiple frequencies of operation ranging between 5 and 10 GHz have been fabricated on the same chip and attained the highest f-Q product (~4.6ldr1012 Hz) ever reported in AlN contour-mode devices. These piezoelectric NEMS resonators are the first of their class to demonstrate on-chip sensing and actuation of nanostructures without the need of cumbersome or power consuming excitation and readout systems. Effective piezoelectric activity has been demonstrated in thin AlN films having vertical and lateral features in the range of 250 nm.
Keywords :
aluminium compounds; crystal resonators; micromechanical resonators; nanoelectromechanical devices; thin films; AlN; contour-mode nanoelectromechanical resonators; f-Q product; frequency 5 GHz to 10 GHz; on-chip sensing; piezoelectric nanoresonators; power consuming excitation; size 250 nm; super high frequency laterally vibrating nanoelctromechanical resonators; thin film; Design engineering; Film bulk acoustic resonators; Nanoelectromechanical systems; Nanoscale devices; Piezoelectric devices; Q factor; Resonance; Resonant frequency; Silicon; Vibrations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 2009. MEMS 2009. IEEE 22nd International Conference on
Conference_Location :
Sorrento
ISSN :
1084-6999
Print_ISBN :
978-1-4244-2977-6
Electronic_ISBN :
1084-6999
Type :
conf
DOI :
10.1109/MEMSYS.2009.4805533
Filename :
4805533
Link To Document :
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