DocumentCode
3046867
Title
Measurement of single event effects in the 87C51 microcontroller
Author
Oberg, Dennis L. ; Wert, Jerry L. ; Normand, E. ; Ness, Joseph D. ; Majewski, Peter P. ; Kennerud, R.A.
Author_Institution
Boeing Defense & Space Group
fYear
1993
fDate
34171
Firstpage
43
Lastpage
50
Keywords
Aerospace testing; Circuit testing; Counting circuits; Cyclotrons; Microcontrollers; Microprocessors; Particle beams; Protons; Read-write memory; Space stations;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 1993., IEEE
Print_ISBN
0-7803-1906-0
Type
conf
DOI
10.1109/REDW.1993.700567
Filename
700567
Link To Document