• DocumentCode
    3047348
  • Title

    Immersion for 40nm production with 1.35NA

  • Author

    Wagner, Christian ; Miyazaki, Junji

  • Author_Institution
    ASML, Veldhoven
  • fYear
    2007
  • fDate
    5-8 Nov. 2007
  • Firstpage
    12
  • Lastpage
    12
  • Abstract
    Summary form only given. Moving at impressive pace, immersion technology has entered volume manufacturing only 3 years after its technical feasibility had been proven. In 2006 Immersion lived up to its promise moving across the NA=1 barrier, with the shipment on 1.2NA exposure tools. Extending water immersion to its limit these tools are now followed by 1.35NA exposure tools for 40nm resolution being shipped in 2007. With an installed base of more than 30 tools the 1.2NA XT:1700Fi has enabled the transition of immersion from technology to volume production. The paper will review the technical status including optics, focus, leveling. Special emphasis will be given on long term performance stability. Regarding Defectivity, performance data as well as best practice process schemes will be discussed. In the second part of the paper the XT:1900Gi will be reviewed. With its industry leading NA of 1.35NA, special emphasis will be given on sub 40nm imaging results, including double patterning applications of 32nm and below. Overlay progress in line with double patterning applications will be presented.
  • Keywords
    immersion lithography; XT:1700Fi; XT:1900Gi; double patterning applications; exposure tools; immersion technology; overlay progress; size 40 nm; volume manufacturing; volume production; water immersion; Best practices; Focusing; Manufacturing; Optical imaging; Production; Stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocesses and Nanotechnology, 2007 Digest of papers
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-4-9902472-4-9
  • Type

    conf

  • DOI
    10.1109/IMNC.2007.4456080
  • Filename
    4456080