DocumentCode :
3047366
Title :
Determination of coherence errors in ADC spectral domain testing
Author :
Bartlett, W.D.
Author_Institution :
Data Acquistion Products Test Engineer, FL, USA
fYear :
1997
fDate :
27 Apr-1 May 1997
Firstpage :
308
Lastpage :
313
Abstract :
Coherence of the input and clock frequencies input to an analog-to-digital converter (ADC) during the spectral domain based effective number of bits (ENOB) test is desirable in order to achieve reproducible results without resorting to windowing functions. Impact of these errors on the ENOB test of an ADC is first discussed. A simple model of an ADC used to test the effect of coherence is given. Then this paper presents a method to detect and measure these coherence errors. The ADC model is used to demonstrate this method. Experimental results applied to a 10-bit 40 MSPS converter with a 10 MHz input sinewave are also presented
Keywords :
analogue-digital conversion; coherence; integrated circuit testing; measurement errors; 10 MHz; 10 bit; ADC spectral domain testing; analog-to-digital converter; clock frequencies input; coherence errors; effective number of bits test; spectral domain based test; Analog-digital conversion; Clocks; Coherence; Fourier series; Frequency conversion; Frequency domain analysis; Frequency measurement; Noise measurement; Power measurement; Semiconductor device testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 1997., 15th IEEE
Conference_Location :
Monterey, CA
ISSN :
1093-0167
Print_ISBN :
0-8186-7810-0
Type :
conf
DOI :
10.1109/VTEST.1997.600294
Filename :
600294
Link To Document :
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