DocumentCode :
3047610
Title :
GaAs nanowhiskers for femtosecond photodetectors and THz emitters
Author :
Mikulics, M. ; Zhang, Juyong ; Sobolewski, R. ; Adam, R. ; Juul, L. ; Marso, M. ; Winden, A. ; Hardtdegen, H. ; Grutzmacher, D. ; Kordos, P.
Author_Institution :
Peter Grunberg Inst. (PGI), Forschungszentrum Julich, Julich, Germany
fYear :
2012
fDate :
11-15 Nov. 2012
Firstpage :
71
Lastpage :
74
Abstract :
We have developed and characterized ultrafast and highly sensitive photodetectors based on GaAs nanowhiskers fabricated with an improved top-down etching method. We evaluated the material properties of the etched nanowhiskers by micro photoluminescence measurements and studied the effect of post annealing on nanowhiskers´ luminescence. The nanowhiskers were integrated into the coplanar striplines for device testing using DC and time-resolved electro-optic characterization techniques. Our photodetectors exhibit a very low dark current below 500 pA at 10 V bias as well as a high responsivity of 0.19 A/W at 30 V, and a cut-off frequency of 1.3 THz. These characteristics make the GaAs nanowhisker photodetectors very promising candidates for high-speed optoelectronics and efficient THz emitters.
Keywords :
III-V semiconductors; annealing; dark conductivity; electro-optical effects; etching; gallium arsenide; nanofabrication; nanosensors; nanostructured materials; photodetectors; photoluminescence; whiskers (crystal); DC electro-optic characterization technique; GaAs; GaAs nanowhisker photodetectors; coplanar striplines; cut-off frequency; dark current; device testing; efficient terahertz emitters; etched nanowhiskers; femtosecond photodetectors; frequency 1.3 THz; high-speed optoelectronics; highly sensitive photodetector; improved top-down etching method; material properties; microphotoluminescence measurements; nanowhisker luminescence; post annealing effect; time-resolved electro-optic characterization technique; ultrafast photodetector; voltage 10 V; voltage 30 V; Annealing; Etching; Fabrication; Gallium arsenide; Nanoscale devices; Photodetectors; Semiconductor device measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Devices & Microsystems (ASDAM), 2012 Ninth International Conference on
Conference_Location :
Smolenice
Print_ISBN :
978-1-4673-1197-7
Type :
conf
DOI :
10.1109/ASDAM.2012.6418553
Filename :
6418553
Link To Document :
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