• DocumentCode
    3047887
  • Title

    Demonstration of Secondary Electron Detection using Monolithic Multi-Channel Electron Detector

  • Author

    Tanimoto, S. ; Pickard, D.S. ; Kenney, C. ; Hasi, J. ; Pease, R.F.W.

  • Author_Institution
    Hitachi Ltd., Kokubunji
  • fYear
    2007
  • fDate
    5-8 Nov. 2007
  • Firstpage
    72
  • Lastpage
    73
  • Abstract
    A multi-channel PIN-diode-based detector is developed. The electrodes, in a linear array with pitch of 250 mum, detect the signals generated by the secondary electrons incident into the other side of the detector. Each detection area has a throughhole, which allows the primary beamlet to pass through. The characterizations are performed by using a primary beamlet of a conventional SEM instead of secondary electrons. The experimental results is consistent with the stimulated prediction.
  • Keywords
    electron detection; lithography; p-i-n diodes; scanning electron microscopy; semiconductor counters; SEM; electrodes; lithography; monolithic multichannel electron detector; multichannel PIN-diode-based detector; primary beamlet; secondary electron detection; Acceleration; Detectors; Electrodes; Electron beams; Laboratories; Magnetic confinement; Magnetic fields; Sensor arrays; Systems biology; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocesses and Nanotechnology, 2007 Digest of papers
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-4-9902472-4-9
  • Type

    conf

  • DOI
    10.1109/IMNC.2007.4456110
  • Filename
    4456110