• DocumentCode
    3048036
  • Title

    The modeling and analysis of shunt type custom power device

  • Author

    Park, Sang-Young ; Park, Jong-Keun

  • Author_Institution
    Sch. of Electr. Eng., Seoul Nat. Univ., South Korea
  • Volume
    1
  • fYear
    2001
  • fDate
    28 Jan-1 Feb 2001
  • Firstpage
    186
  • Abstract
    In the field of custom power device application, the modeling of the power converter is very difficult and important. The shunt (parallel) type custom power devices are based on the high frequency carrier voltage source converter. In this paper, the authors propose two measuring methods of AC side modeling by the dead time voltage and the semiconductor device loss. One is the open loop. Another is the closed-loop test. From these, one can match the values of mathematical experimental values. The results of 2 kVA and 43 kW experiments/simulations show that the AC side resistance of the theoretical and experimental results agree well. The authors propose the D-Q circuit model based new ellipses and a circle of the operation. The ellipse of the reactance and the AC side voltage curves are newly offered which origins are depended on the AC side equivalent resistance
  • Keywords
    DC-AC power convertors; PWM invertors; equivalent circuits; power semiconductor switches; semiconductor device models; static VAr compensators; switching circuits; 2 kVA; 43 kW; AC side equivalent resistance; AC side measuring methods; AC side voltage curves; D-Q circuit model; PWM VSI; STATCOM; dead time voltage; high frequency carrier voltage source converter; power converter modelling; semiconductor device loss; shunt-type custom power device; voltage source invertors; Automatic voltage control; Circuit testing; Control systems; Flexible AC transmission systems; Pulse width modulation; Pulse width modulation inverters; Resistors; STATCOM; Shunt (electrical); Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Engineering Society Winter Meeting, 2001. IEEE
  • Conference_Location
    Columbus, OH
  • Print_ISBN
    0-7803-6672-7
  • Type

    conf

  • DOI
    10.1109/PESW.2001.917030
  • Filename
    917030