Title :
Investigation of MQW GaInNAs/GaAs p-i-n photodetector
Author :
Khalil, H.M. ; Balkan, N. ; Mazzucato, S.
Author_Institution :
Sch. of Comput. Sci. & Electron. Eng., Univ. of Essex, Colchester, UK
Abstract :
Transient photoconductivity (TPC), detectivity (D), and noise-equivalent power (NEP) in a dilute nitride based GaInNAs/GaAs multiple quantum well photodetector operating at λ >;1.3 μm are investigated at different temperatures from 100 to 300K. In this temperature range the TPC rise time increases from around 2 ns to 4 ns. The decay PC decays exponentially with two time constants; the fast one of about 5 ns which is independent on temperature, is followed by a slower one of 200 ns at T=100 K, and 520 ns at room temperature. The maximum detectivity of the photodetector is 6.6×109cm√(Hz)/W and the minimum NEP is 3.6×10-11W/√(Hz), indicating a reasonably fast and sensitive low-noise photodetector.
Keywords :
III-V semiconductors; gallium arsenide; gallium compounds; indium compounds; photoconductivity; photodetectors; semiconductor quantum wells; wide band gap semiconductors; GaInNAs-GaAs; MQW p-i-n photodetector; low-noise photodetector; multiple quantum well photodetector; temperature 100 K to 300 K; temperature 293 K to 298 K; transient photoconductivity; transient photodetectivity; Gallium arsenide; Measurement by laser beam; Photodetectors; Quantum well devices; Temperature measurement; Temperature sensors; Transient analysis;
Conference_Titel :
Advanced Semiconductor Devices & Microsystems (ASDAM), 2012 Ninth International Conference on
Conference_Location :
Smolenice
Print_ISBN :
978-1-4673-1197-7
DOI :
10.1109/ASDAM.2012.6418578