DocumentCode
3048727
Title
Observation Of Single Event Latchup In Bipolar Devices
Author
Shop, M. ; Gorelick, J. ; Rau, R. ; Kop, Reinier ; Martinez, A.
Author_Institution
Hughes Space & Communication Company
fYear
1993
fDate
34171
Firstpage
118
Lastpage
120
Keywords
Aerospace testing; Current supplies; High speed optical techniques; Laboratories; Logic arrays; Logic devices; Logic testing; Particle beam optics; Temperature dependence; Temperature distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 1993., IEEE
Print_ISBN
0-7803-1906-0
Type
conf
DOI
10.1109/REDW.1993.700577
Filename
700577
Link To Document