DocumentCode
3049391
Title
On adjacent asymmetric error masking (AAEM) codes
Author
Tallini, L.G. ; Bose, B.
Author_Institution
Dept. of Comput. Sci., Oregon State Univ., Corvallis, OR, USA
fYear
1997
fDate
29 Jun-4 Jul 1997
Firstpage
294
Abstract
Matsuzawa and Fujiwara (1988) have proposed a novel scheme to mask line faults of bus line circuits (such as address buses) due to short circuit defects between adjacent lines. We propose the fundamental theory and then present some efficient designs of these codes. Some lower and upper bounds for the optimal codes are also given
Keywords
codes; fault tolerant computing; system buses; address buses; adjacent asymmetric error masking codes; adjacent lines; bus line circuits; line faults; lower bounds; optimal codes; short circuit defects; upper bounds; Circuit faults; Computer errors; Computer science; Decoding; Random access memory; Read only memory; Read-write memory; Upper bound; Very large scale integration; Virtual manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Theory. 1997. Proceedings., 1997 IEEE International Symposium on
Conference_Location
Ulm
Print_ISBN
0-7803-3956-8
Type
conf
DOI
10.1109/ISIT.1997.613215
Filename
613215
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