DocumentCode :
3049627
Title :
Erbium doped fibre optogeometrical and equivalent step index parameters determination from transmitted near-field measurements
Author :
Ravet, F. ; Heens, B. ; Megret, P. ; Moeyaert, V. ; Blondel, M.
Author_Institution :
Service d´´Electromagnetisme et de Telecommun., Fac. Polytech. de Mons, Belgium
Volume :
3
fYear :
1996
fDate :
13-16 May 1996
Firstpage :
1501
Abstract :
We study the optogeometrical and the equivalent step index parameters of a commercial erbium doped fibre. Our set-up is based on the Transmitted Near Field Technique (TNFT). The combination of the TNFT with an infrared camera opens the possibility of yielding very quick measurements. The refractive index profile difference and the mode field diameter have been determined from the near field intensity pattern. Then optogeometrical and two sets of equivalent step-index parameters have been calculated. Finally all these parameters have been used to compute the modelled intensity profiles. We compare these calculated patterns with experiment. All measurements and calculations are carried out at 1310 nm and 1550 nm
Keywords :
erbium; optical fibre testing; optical fibre theory; refractive index; 1310 nm; 1550 nm; Er doped fibre; equivalent step index parameters; infrared camera; intensity profiles; mode field diameter; near field intensity pattern; optogeometrical parameters; refractive index profile difference; transmitted near-field measurements; Apertures; Erbium; Frequency; Optical fiber testing; Optical fibers; Partial differential equations; Refractive index; Tiles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrotechnical Conference, 1996. MELECON '96., 8th Mediterranean
Conference_Location :
Bari
Print_ISBN :
0-7803-3109-5
Type :
conf
DOI :
10.1109/MELCON.1996.551235
Filename :
551235
Link To Document :
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