DocumentCode :
3049851
Title :
Grain Size Effect on Nano-Pattern Formability in Direct Imprint
Author :
Yao, C.H. ; Wu, C.L. ; Sung, C.K.
Author_Institution :
Univ. of Nat. Tsing Hua, Hsinchu
fYear :
2007
fDate :
5-8 Nov. 2007
Firstpage :
310
Lastpage :
311
Abstract :
This paper presents an experimental study on the effects of thin-film properties on metallic pattern formation by using direct imprint process. The mechanical properties like hardness and Young´s modulus are characterized by nanoindentation test. From the experimental results, the following phenomena can be observed. With the increase of the grain size in the thin films, the formation height and the hardness will be higher and softer because the grain boundary could enhance the hardness of the thin films. On the strength of that, the aluminum thin films deposited by DC sputter could have better formability for the process of direct imprint.
Keywords :
Young´s modulus; grain boundaries; grain size; hardness; indentation; metallic thin films; nanopatterning; Young´s modulus; direct imprint; grain boundary; grain size; hardness; metallic pattern formation; nanoindentation; naonpattern formability; thin film; Aluminum; Distributed control; Fabrication; Grain size; Mechanical factors; Polymer films; Sputtering; Surface topography; Testing; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocesses and Nanotechnology, 2007 Digest of papers
Conference_Location :
Kyoto
Print_ISBN :
978-4-9902472-4-9
Type :
conf
DOI :
10.1109/IMNC.2007.4456228
Filename :
4456228
Link To Document :
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