A general spectral domain formulation for characterization of finlines with different sidewall widths

A new spectral domain formulation for characterization of finlines with different sidewall widths is proposed. In original spectral domain approach; the structures are limited to those with iafinitesmally thin metals and same sidewall widths. Here, the new formulation utilizes the equivalence principle to separate the regions of different sidewall widths. The resulting equivalences can then be treated with the immittance approach as in conventional spectral domain approach. The formulation procedure is systematic and can treat a variety of structures. It is applied to analyze the effects of metal thickness and mounting grooves on propagation characteristics of finlines.