DocumentCode
3050156
Title
Series graded gapped arrester provides reliable overvoltage protection in distribution systems
Author
Goedde, G.L. ; Kojovic, Lj A. ; Marz, M.B. ; Woodworth, J.J.
Author_Institution
Cooper Power Syst., Franksville, WI, USA
Volume
3
fYear
2001
fDate
2001
Firstpage
1122
Abstract
This paper compares the operating characteristics and energy handling capabilities of series graded gapped (SGG) and gapless metal oxide varistor (MOV) distribution class surge arresters. Application considerations are analyzed for both SGG and gapless MOV arresters using field results, laboratory tests and computer simulations. A large number of SGG arresters are installed on distribution systems throughout the USA. Field experience has demonstrated that they are extremely reliable devices with very low failure rates. Because SGG arresters have higher temporary overvoltage (TOV) ratings than gapless MOV arresters, they are often used to replace gapless MOV arresters when temporary overvoltage is a concern. Field experience also indicates that SGG arrester energy handling capability is at least equivalent to that of conventional arresters. This paper demonstrates that the arrester rated lightning impulse discharge capability is not properly characterized by the energy absorbed by the arrester. A proposed method is to use the I2t value instead of absorbed energy because it correctly characterizes arrester energy handling and is easy to use
Keywords
arresters; lightning protection; overvoltage protection; power distribution protection; varistors; I2t value; USA; computer simulations; distribution class surge arresters; distribution systems; energy handling capabilities; gapless metal oxide varistor; higher temporary overvoltage ratings; laboratory tests; lightning impulse discharge capability; reliable overvoltage protection; series graded gapped arrester; series graded gapped metal oxide varistor; very low failure rates; Arresters; Computer simulation; Impulse testing; Lightning; Power system protection; Power system reliability; Silicon carbide; Surge protection; System testing; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Engineering Society Winter Meeting, 2001. IEEE
Conference_Location
Columbus, OH
Print_ISBN
0-7803-6672-7
Type
conf
DOI
10.1109/PESW.2001.917229
Filename
917229
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