DocumentCode :
3050652
Title :
A dielectric layer at the interface between metals and superconducting ceramics
Author :
Kliem, H. ; Weyers, A. ; Kamienski, E. Stein v ; Arlt, G.
Author_Institution :
Inst. fur Werkstoffe der Electrotech., Aachen Univ. of Technol., Germany
fYear :
1990
fDate :
28-31 Oct 1990
Firstpage :
146
Lastpage :
151
Abstract :
An attempt was made to develop a low-resistivity metal/superconductor contact which is stable to mechanical stress and durable against temperature variation. YBa2Cu3 O7-x ceramics were produced by mixed oxide preparation and a sintering process in O2 for 16 h at 950°C with a final cooling rate of 50 K/h. Surfaces were polished with silicon carbide and then Al, Cu, Au or Ag were evaporated onto the ceramic at a pressure of 10-5 mbar. For measurement of the voltage-current relation of the contact a current Idc was fed through the contact and in a four-point probe arrangement the voltage was measured. In order to derive the differential resistance δUl(U), a small AC current (28 Hz or 580 Hz) was superimposed on the DC current. The contact capacitance was measured for f⩽10 MHz with a standard capacitance bridge and for f⩾1 MHz by a reflection technique where the sample was placed at the end of a coaxial line. Results on contact resistance and capacitance are presented
Keywords :
barium compounds; ceramics; high-temperature superconductors; superconducting junction devices; yttrium compounds; 16 h; 1E-5 mbar; 28 Hz; 580 Hz; 950 degC; Ag-YBa2Cu3O7-x; Al-YBa2Cu3O7-x; Au-YBa2Cu3O7-x; Cu-YBa2Cu3O7-x; coaxial line; contact capacitance; contact resistance; dielectric layer; differential resistance; four-point probe arrangement; low-resistivity metal/superconductor contact; mechanical stress; mixed oxide preparation; reflection technique; sintering process; standard capacitance bridge; temperature variation; voltage-current relation; Capacitance; Ceramics; Cooling; Current measurement; Dielectrics; Electrical resistance measurement; Stress; Superconducting epitaxial layers; Temperature; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1990. Annual Report., Conference on
Conference_Location :
Pocono Manor, PA
Type :
conf
DOI :
10.1109/CEIDP.1990.201334
Filename :
201334
Link To Document :
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