DocumentCode :
3050811
Title :
Electrical and structural studies of plasma-polymerized fluorocarbon films
Author :
Amyot, N. ; Wertheimer, M.R. ; Ségui, Y. ; Moisan, M.
Author_Institution :
Dept. of Eng. Phys., Ecole Polytech., Montreal, Que., Canada
fYear :
1990
fDate :
28-31 Oct 1990
Firstpage :
208
Lastpage :
218
Abstract :
A series of PPFC (plasma-polymerized fluorocarbon) film materials having widely varying compositions and properties was studied. Fluorine-rich (Teflon-like) films (F/C≳1.7) were found to have relatively low degrees of oxidation, as manifested by their infrared and XPS spectra. Strong correlations between film compositions and their electrical properties were found. The TSD spectra of PPFC films are reported: the α and β relaxations observed near 50°C and -80°C, respectively, correlate well with dielectric relaxations corresponding to carbonyl dipoles and to local motions of fluorocarbon chain segments observed by other workers. The charge storage time constants shows rough correlation with F/ C; the large scatter of data, however, suggests that this relationship should be the object of further studies
Keywords :
X-ray photoelectron spectra; dielectric relaxation; infrared spectra of organic molecules and substances; organic insulating materials; polymer films; thermally stimulated currents; α relaxations; β relaxations; -80 C; 50 C; IR spectra; PPFC films; TSD spectra; XPS spectra; charge storage time constants; dielectric relaxations; electrical properties; film compositions; fluorine/carbon ratio; plasma-polymerized fluorocarbon films; scatter of data; structural properties; Electrets; Fabrication; Material storage; Plasma applications; Plasma materials processing; Plasma measurements; Plasma properties; Plasma temperature; Plasma waves; Polymer films;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1990. Annual Report., Conference on
Conference_Location :
Pocono Manor, PA
Type :
conf
DOI :
10.1109/CEIDP.1990.201344
Filename :
201344
Link To Document :
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