Charging phenomena, dielectric relaxation processes and breakdown of oxides

Scanning electron microscopy and surface science techniques were used to characterize insulators by their complex susceptibility, local variation of this susceptibility, and kinetics of dipolar relaxation, leading to the catastrophe phenomenon. It is shown that the insulator charging-up is due to trapping of the carriers, this being related to the presence of defects and to variation of the susceptibility. The frequency response of the dielectric allows one to investigate the mechanisms of polarization energy transfer to the phonon bath. Fast dipolar relaxation leads to a set of catastrophe phenomena such as flashover, fractures, and mechanical shock waves. An explanation of these phenomena leads to an explanation of the technological properties of organic and inorganic insulators