Title :
Effect of Lorentz force on the conducting contaminant trajectory in a three phase Gas Insulated Busduct
Author :
Padmavathi, D. ; Amarnath, J. ; Kamakshaiah, S.
Author_Institution :
J.B Inst. of Eng. & Technol., Hyderabad, India
Abstract :
The main cause for the most of the failures in Gas Insulated Busduct is attributed to the presence of metallic particle contaminations in the form of loose particles, which may exist on the inner surface of outer enclosure of GIB or on HV conductor. These conducting particles under the influence of high voltage may acquire sufficient charge and randomly move in the inter electrode gap due to variable electric field. In this paper, conducting particle trajectory is obtained for 300 kV, 400 kV and 500 kV power frequency voltages in a Gas Insulated Busduct (GIB) with SF6 as dielectric medium considering the effect of Lorentz force. Conducting contaminants considered are Copper, Aluminum and Silver particles of radius 0.1 mm and length 10 mm of wire type in a GIB of an outer enclosure diameter 500 mm and inner conductor of diameter 64 mm is considered. The motion of the wire particle and these particles will be of irregular cross section and can move in any direction and therefore the movement of the particle may be simulated using Monte-Carlo Technique.
Keywords :
Monte Carlo methods; SF6 insulation; aluminium; conductors (electric); copper; electric field effects; gas insulated substations; insulator contamination; silver; Ag; Al; Cu; Lorentz force; Monte Carlo technique; SF6 dielectric medium; conducting contaminant; conducting particle trajectory; power frequency voltages; size 0.1 mm; size 10 mm; size 500 mm; size 64 mm; three phase gas insulated busduct; variable electric field; voltage 300 kV; voltage 400 kV; voltage 500 kV; Conductors; Copper; Dielectrics and electrical insulation; Electrodes; Frequency; Gas insulation; Lorentz covariance; Surface contamination; Voltage; Wire;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2009. CEIDP '09. IEEE Conference on
Conference_Location :
Virginia Beach, VA
Print_ISBN :
978-1-4244-4557-8
Electronic_ISBN :
0084-9162
DOI :
10.1109/CEIDP.2009.5377763