• DocumentCode
    3051
  • Title

    An 11 b 7 ps Resolution Two-Step Time-to-Digital Converter With 3-D Vernier Space

  • Author

    Yeomyung Kim ; Tae Wook Kim

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea
  • Volume
    61
  • Issue
    8
  • fYear
    2014
  • fDate
    Aug. 2014
  • Firstpage
    2326
  • Lastpage
    2336
  • Abstract
    This paper presents a fine-resolution time-to-digital converter (TDC) with a large dynamic range using a 3-D Vernier space. Despite the wide dynamic range, the required delay cells in the delay-lines are minimized, leading to better power efficiency. The proposed TDC also exploits the redundancy and error-correction technique to solve the offset error of coarse conversion in the 3-D Vernier space architecture. The TDC is implemented using a 0.13- μm CMOS process. The measurement result shows a dynamic range with an 11-bit 6.98-ps resolution, an integrated nonlinearity of ±1.5 LSB, a power consumption of 328.8 μW, and a die area of 0.28 mm2.
  • Keywords
    CMOS digital integrated circuits; delay lines; time-digital conversion; 3D Vernier space architecture; CMOS process; delay cells; delay lines; fine-resolution time-to-digital converter; power 328.8 muW; size 0.13 mum; word length 11 bit; Computer architecture; Delays; Dynamic range; Error correction; Linearity; Power demand; Redundancy; 3-D Vernier space; High integrated nonlinearity; redundancy and error correction; time-of-flight (ToF) application; time-to-digital converter (TDC); zoom-in architecture;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Regular Papers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-8328
  • Type

    jour

  • DOI
    10.1109/TCSI.2014.2304656
  • Filename
    6747404