Title :
Defect-induced electrical signals in solid dielectric power cable and implications thereof for defect location
Author :
Kuang, Jinbo ; Boggs, Steven
Author_Institution :
Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada
Abstract :
When a surge is applied to a solid dielectric cable with a stress-enhancement-containing defect, the current which flows to produce a field-limiting space charge surrounding the defect generates a signal on the conductor of the cable. Based on transient, nonlinear finite element computations of the defect-induced current, we predict the nature of this signal as a function of the applied surge waveform and defect severity, and we investigate implications for defect location during a factory cable reel test
Keywords :
XLPE insulation; fault location; finite element analysis; flaw detection; insulation testing; power cable insulation; power cable testing; signal detection; space charge; surges; transient analysis; waveform analysis; 230 kV; XLPE; applied surge waveform; cable conductor signal; defect location; defect severity; defect-induced current; defect-induced electrical signals; factory cable reel test; field-limiting space charge; resistive current; solid dielectric power cable; stress-enhancement-containing defect; terminal current; transient nonlinear finite element computations; Conductors; Dielectrics; Finite element methods; Power cables; Production facilities; Signal generators; Solids; Space charge; Surges; Testing;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1996., IEEE 1996 Annual Report of the Conference on
Conference_Location :
Millbrae, CA
Print_ISBN :
0-7803-3580-5
DOI :
10.1109/CEIDP.1996.564600
