• DocumentCode
    3051285
  • Title

    Measurement of electrical surface charge distribution on insulating material by electrooptic Pockels cell

  • Author

    Kawasaki, T. ; Arai, Y. ; Takada, T.

  • Author_Institution
    Musashi Inst. of Technol., Tokyo, Japan
  • fYear
    1990
  • fDate
    28-31 Oct 1990
  • Firstpage
    373
  • Lastpage
    378
  • Abstract
    The authors have developed a method by which one can obtain the surface charge pattern and density on the BSO (Bi12SiO20 ) crystal surface by means of the electrooptic Pockels effect of the BSO crystal and a video tape recording system. The measurement of electrical charge distribution on an insulator surface and the discrimination of electrical charge polarity using circular polarized incident light and BSO crystal is demonstrated
  • Keywords
    charge measurement; electro-optical devices; insulation testing; nondestructive testing; BSO crystal; Bi12SiO20; charge density; charge pattern; circular polarized incident light; electrical charge polarity; electrical surface charge distribution; electrooptic Pockels cell; insulating material; measurement; video tape recording system; Birefringence; Charge measurement; Current measurement; Dielectric constant; Dielectrics and electrical insulation; Electric variables measurement; Electrodes; Optical polarization; Optical recording; Optical surface waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1990. Annual Report., Conference on
  • Conference_Location
    Pocono Manor, PA
  • Type

    conf

  • DOI
    10.1109/CEIDP.1990.201370
  • Filename
    201370
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3051285