• DocumentCode
    3051317
  • Title

    Permittivity measurements on molecular-sized samples

  • Author

    van Roggen, A. ; Yuwono, L. ; Zhou, Hong ; Meijer, P.H.E. ; Kopanski, J.

  • Author_Institution
    Dept. of Phys., Catholic Univ. of America, Washington, DC, USA
  • fYear
    1990
  • fDate
    28-31 Oct 1990
  • Firstpage
    385
  • Lastpage
    390
  • Abstract
    Experimental and instrumental design is described in connection with efforts to make organic bistable devices. One of the research goals is to measure the electrical properties of materials and active devices made with molecular (mainly organic) materials. The size of material samples, and the specimens used for measurement, are exceedingly small, typically layers with a thickness on the order of 100 nm. Preliminary results on polyethylene crystals grown under properly controlled circumstances from solutions of PE in xylene are presented
  • Keywords
    permittivity; permittivity measurement; polymers; 100 nm; electrical properties; instrumental design; molecular-sized samples; organic bistable devices; polyethylene crystals; xylene; Conducting materials; Dielectric materials; Dielectric measurements; Electrical resistance measurement; Electrodes; Instruments; Laboratories; Organic materials; Permittivity measurement; Physics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1990. Annual Report., Conference on
  • Conference_Location
    Pocono Manor, PA
  • Type

    conf

  • DOI
    10.1109/CEIDP.1990.201372
  • Filename
    201372