Ultra-high temperature ablation image acquisition and analysis system based on CCD

Author

Wang, Zhiwen ; Peng, Xiuyan

Author_Institution

Coll. of Autom., Harbin Eng. Univ., Harbin, China

fYear

2010

fDate

20-23 June 2010

Firstpage

2234

Lastpage

2237

Abstract

A system, which can capture the real time image of ablative surface under strong stray light environments caused by plasma arc, has been presented. The system has been under nearly one year of service in some national key laboratory. It has been shown that the system can effectively shield the influence of plasma jet and stray light with the temperature over 4,000 K and in the meanwhile, high quality image (with the resolution of 0.01 mm) of ablative surface (with the temperature of 3,000 K) can be obtained. The image acquisition system provided in the present paper can not only be applied to plasma jet on-line monitoring, but also be used in other areas which require real-time monitoring under strong stray light environments.

Keywords

CCD image sensors; data acquisition; data analysis; image processing; plasma jets; stray light; CCD; ablative surface; national key laboratory; plasma arc; plasma jet online monitoring; real time image; stray light environments; ultra high temperature ablation image acquisition; Charge coupled devices; Image analysis; Image resolution; Monitoring; Plasma applications; Plasma simulation; Plasma temperature; Protection; Real time systems; Stray light; CCD; Image acquisition; Image analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Information and Automation (ICIA), 2010 IEEE International Conference on

Conference_Location

Harbin

Print_ISBN

978-1-4244-5701-4

Type

conf

DOI

10.1109/ICINFA.2010.5512442

Filename

5512442